2026



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    1. K. Takaki; S. Furuichi; M. Kosugi; H. Arisawa; Y.-C. Lin; T. Taniguchi; K. Watanabe; Y. Nonaka; K. Suenaga; E. Saitoh; J. Haruyama
      "Stochastic behaviors of electrons through atom-vacancy
      defects in few atom-layer MoS2-FETs and neuromorphic
      device application"
      APL Electronic Devices 2 (2026)

    2. A. M. Abdallah; H. Arisawa; Y. Nonaka; Y. Kasai; R. Fujikawa; E. Saitoh; J. Haruyama
      "Exchange bias effect in thin Fe3GeTe2 and Fe5GeTe2 flakes sensitive to oxidation and annealing methods"
      Appl. Phys. Lett. 128, 082403 (2026)